---
publication_id: "OT-2026-000000197"
title: "Real-time three-dimensional shape measurement system and shape measurement method using diagonal line pattern irradiation method"
published_at: "2026-09-15T19:02:35.994013Z"
canonical_url: "https://opentechnical.org/p/OT-2026-000000197"
categories:
  - "sensors-controls-machine-vision/position-and-presence-sensing"
keywords:
  - "g01b11/2513"
  - "g06t17/00"
  - "g06t2200/04"
  - "g06t7/50"
---

# Real-time three-dimensional shape measurement system and shape measurement method using diagonal line pattern irradiation method

## Abstract

The present disclosure relates to relates to a system and method for measuring a real-time three dimensional shape using a diagonal fringe pattern. Particularly, in the deflectometry applied to real-time three dimensional shape measurement of freeform surfaces, a system for acquiring a real-time three dimensional phase using a diagonal fringe pattern includes: a pattern generation portion that generates a single-direction pattern in the diagonal direction and project the generated pattern onto a measurement object; a detector that obtains an image of a deformed pattern reflected from the measurement object; and a phase acquisition portion that partially differentiates and integrates a phase of the diagonal pattern in the x axis direction and y axis direction respectively, to obtain an x axis direction phase component and a y direction phase component.