{
  "abstract": "A system and a method for synchronously detecting thickness and double-side surface profiles that belongs to the technical field of optical measurement. The system includes a light source system, a deflection reflection system, a camera acquisition system, and a processing system. The deflection reflection system includes a decomposition unit and an integration unit. In the system, an optical signal is projected to an upper surface and a lower surface of an object to be measured by the decomposition unit, and then reflected light is converged by the integration unit to form a composite signal, which is captured by a camera to generate an image. The processing system analyzes the image to accurately obtain the thickness and double-side surface profile data of the object.",
  "canonical_url": "https://opentechnical.org/p/OT-2026-000000299",
  "categories": [
    "sensors-controls-machine-vision/position-and-presence-sensing"
  ],
  "extent": {
    "figures": 0,
    "paragraphs": 0,
    "words": 123
  },
  "figures": [],
  "files": [
    {
      "bytes": 9986,
      "media_type": "text/html; charset=utf-8",
      "name": "index.html",
      "sha256": "be7eaa84aec2d7ff29aa6a881d004e61d7d9f2e9a35a9041b8c0437c33160e1f"
    },
    {
      "bytes": 1294,
      "media_type": "text/markdown; charset=utf-8",
      "name": "publication.md",
      "sha256": "00f4bc8afc5ffd744dc1045049bc3840d9678d112f53848c8ae15c23617a3826"
    },
    {
      "bytes": 1383,
      "media_type": "text/plain; charset=utf-8",
      "name": "publication.txt",
      "sha256": "48e09038f98c5f504e36971b18a9944ca5c502ba3e1d062efbabc8153bd224d9"
    }
  ],
  "integrity": {
    "hash_algorithm": "sha256",
    "keys_url": "https://opentechnical.org/integrity/keys",
    "record_url": "https://opentechnical.org/p/OT-2026-000000299/integrity",
    "signature_algorithm": "Ed25519",
    "signature_file": "manifest.sig",
    "verify_url": "https://opentechnical.org/integrity/verify"
  },
  "keywords": [
    "g01b11/06",
    "g01b11/0608",
    "g01b11/2441",
    "g01b21/08"
  ],
  "language": "en",
  "license": {
    "name": "Creative Commons Attribution 4.0 International",
    "url": "https://creativecommons.org/licenses/by/4.0/"
  },
  "publication_id": "OT-2026-000000299",
  "published_at": "2026-09-15T19:02:43.087067Z",
  "publisher": "Nebula Innovations Limited",
  "record_type": "record",
  "schema": "opentechnical-publication-manifest/1.0",
  "source_date": "2026-04-21",
  "source_id": "US-12607453-B2",
  "source_name": "the United States Patent and Trademark Office",
  "source_url": "https://patents.google.com/patent/US12607453B2",
  "supersedes": null,
  "title": "System and method for synchronously detecting thickness and double-side surface profiles",
  "uuid": "01a0a673-348e-7d86-8683-854899e642f8"
}