---
publication_id: "OT-2026-000000299"
title: "System and method for synchronously detecting thickness and double-side surface profiles"
published_at: "2026-09-15T19:02:43.087067Z"
canonical_url: "https://opentechnical.org/p/OT-2026-000000299"
categories:
  - "sensors-controls-machine-vision/position-and-presence-sensing"
keywords:
  - "g01b11/06"
  - "g01b11/0608"
  - "g01b11/2441"
  - "g01b21/08"
---

# System and method for synchronously detecting thickness and double-side surface profiles

## Abstract

A system and a method for synchronously detecting thickness and double-side surface profiles that belongs to the technical field of optical measurement. The system includes a light source system, a deflection reflection system, a camera acquisition system, and a processing system. The deflection reflection system includes a decomposition unit and an integration unit. In the system, an optical signal is projected to an upper surface and a lower surface of an object to be measured by the decomposition unit, and then reflected light is converged by the integration unit to form a composite signal, which is captured by a camera to generate an image. The processing system analyzes the image to accurately obtain the thickness and double-side surface profile data of the object.