OPENTECHNICAL PUBLICATION
OT-2026-000000299

System and method for synchronously detecting thickness and double-side surface profiles

Published: 2026-09-15T19:02:43.087067Z
Permanent URL: https://opentechnical.org/p/OT-2026-000000299
Categories: Sensors, Controls & Machine Vision > Position and Presence Sensing

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ABSTRACT

A system and a method for synchronously detecting thickness and double-side
surface profiles that belongs to the technical field of optical measurement.
The system includes a light source system, a deflection reflection system, a
camera acquisition system, and a processing system. The deflection reflection
system includes a decomposition unit and an integration unit. In the system,
an optical signal is projected to an upper surface and a lower surface of an
object to be measured by the decomposition unit, and then reflected light is
converged by the integration unit to form a composite signal, which is
captured by a camera to generate an image. The processing system analyzes the
image to accurately obtain the thickness and double-side surface profile data
of the object.

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OpenTechnical publication OT-2026-000000299
Published 2026-09-15T19:02:43.087067Z
https://opentechnical.org/p/OT-2026-000000299