---
publication_id: "OT-2026-000002986"
title: "Backscatter x-ray system and method"
published_at: "2026-09-15T19:16:34.588002Z"
canonical_url: "https://opentechnical.org/p/OT-2026-000002986"
categories:
  - "sensors-controls-machine-vision/industrial-control"
keywords:
  - "b64f5/10"
  - "g01n23/203"
  - "g05b13/042"
  - "b21j15/142"
  - "b21j15/142"
  - "b25j11/005"
---

# Backscatter x-ray system and method

## Abstract

A backscatter x-ray system has an x-ray device, a movable platform, and a processor. The x-ray device includes an x-ray emitter and an x-ray detector. The movable platform positions the x-ray device relative to a frontside of a structure. The processor is communicatively couplable to the x-ray device. The x-ray emitter emits x-rays that penetrate the structure from the frontside. The x-ray detector detects a backscatter of the x-rays reflected from the structure. The processor generates x-ray images of the structure based on the backscatter, and analyzes the x-ray images in a manner facilitating at least one of manufacturing and inspection of the structure.