OPENTECHNICAL PUBLICATION
OT-2026-000002986

Backscatter x-ray system and method

Published: 2026-09-15T19:16:34.588002Z
Permanent URL: https://opentechnical.org/p/OT-2026-000002986
Categories: Sensors, Controls & Machine Vision > Industrial Control

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ABSTRACT

A backscatter x-ray system has an x-ray device, a movable platform, and a
processor. The x-ray device includes an x-ray emitter and an x-ray detector.
The movable platform positions the x-ray device relative to a frontside of a
structure. The processor is communicatively couplable to the x-ray device. The
x-ray emitter emits x-rays that penetrate the structure from the frontside.
The x-ray detector detects a backscatter of the x-rays reflected from the
structure. The processor generates x-ray images of the structure based on the
backscatter, and analyzes the x-ray images in a manner facilitating at least
one of manufacturing and inspection of the structure.

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OpenTechnical publication OT-2026-000002986
Published 2026-09-15T19:16:34.588002Z
https://opentechnical.org/p/OT-2026-000002986