---
publication_id: "OT-2026-000003027"
title: "Control device of flaw detection device and quality management support method"
published_at: "2026-09-15T19:16:50.323829Z"
canonical_url: "https://opentechnical.org/p/OT-2026-000003027"
categories:
  - "robotics-automation/robot-architectures"
keywords:
  - "b25j9/163"
  - "b25j9/163"
  - "b25j13/08"
  - "b25j13/08"
  - "b25j9/1679"
  - "b25j9/1679"
---

# Control device of flaw detection device and quality management support method

## Abstract

A control device (40) of a flaw detection device uses, as a control target, a flaw detection device provided with a probe (28a) and a robot arm (26) that presses the probe against an inspection object. The control device executes tracing processing, learning processing, and inspection processing. In the tracing processing, the probe is moved along the inspection object while being brought into contact with the inspection object by operating the robot arm. In the learning processing, the shape of the inspection object is learned according to the position of the probe for every movement thereof in the tracing processing. In the inspection processing, the inspection object is inspected by using the reflected wave of the ultrasonic wave transmitted while displacing the probe brought into contact with the inspection object according to the shape of the inspection object learned by the learning processing.