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This is a record of a document published elsewhere, first published by the United States Patent and Trademark Office, as US-2026104246-A1, on 16 April 2026. OpenTechnical did not first disclose it. The identifier, hashes and timestamps below record what this library served and when, not when the material became public. View the original.

OT-2026-000000423

Polarization-sensitive probe for low coherence interferometer system

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Sensors, Controls & Machine Vision › Position and Presence Sensing
Original source
US-2026104246-A1, the United States Patent and Trademark Office, 16 April 2026
Document SHA-256
c18aed579524d95067cda1d19c9147b68c6640efd898e945f3057ebb2e601456

Abstract

The invention describes a novel optical coherence tomography probe allowing polarization control of the beam impinging and polarization analysis of the beam reflected from the sample, allowing polarization characterization of the reflectance of the measured sample.

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Citation

OpenTechnical Publication OT-2026-000000423, “Polarization-sensitive probe for low coherence interferometer system,” published September 15, 2026 at 19:02:52 UTC, https://opentechnical.org/p/OT-2026-000000423.

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