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This is a record of a document published elsewhere, first published by the United States Patent and Trademark Office, as US-2026104700-A1, on 16 April 2026. OpenTechnical did not first disclose it. The identifier, hashes and timestamps below record what this library served and when, not when the material became public. View the original.

OT-2026-000000453

Event detection device testing

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Permanent URL
Classification
Sensors, Controls & Machine Vision › Industrial Control
Original source
US-2026104700-A1, the United States Patent and Trademark Office, 16 April 2026
Document SHA-256
1a37d4daf973639fbaf3072358ea8a0bf1f9911bee7fb04ba15cca904eb7b860

Abstract

Devices, methods, and systems for event detection device testing are described herein. One device includes a memory and a processor to execute instructions stored in the memory to enable a filter-mode while the event detection device is simultaneously operating in a normal operational mode, cause a self-test module of the event detection device to generate an amount of test medium for a testing chamber of the event detection device, cause an air movement device of the event detection device to pass the test medium through the testing chamber, and cause the event detection device to perform an anti-mask test using the test medium to determine whether the testing chamber is blocked while in the filter-mode.

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Citation

OpenTechnical Publication OT-2026-000000453, “Event detection device testing,” published September 15, 2026 at 19:02:54 UTC, https://opentechnical.org/p/OT-2026-000000453.

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This record reproduces a document published elsewhere and is provided for reference and study. Rights in the original remain with its owner. See the publication policy.