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This is a record of a document published elsewhere, first published by the United States Patent and Trademark Office, as US-2026057504-A1, on 26 February 2026. OpenTechnical did not first disclose it. The identifier, hashes and timestamps below record what this library served and when, not when the material became public. View the original.

OT-2026-000002506

Bulk Pallet Inspection and Assembly

Published
Permanent URL
Classification
Sensors, Controls & Machine Vision › Position and Presence Sensing
Inventors
DEL VALLE CHRISTOPHER COUTURE, EVANS JAMES C, GEORGE PAUL S, PIEKARSKI CHRISTOPHER J
Assignee
LUXTRONIC INC
Original source
US-2026057504-A1, the United States Patent and Trademark Office, 26 February 2026
Document SHA-256
49f749ea8ad354e173cb15c0757b618b960635bc2606ba2ecff981daae44de61

Abstract

This disclosure provides methods, components, devices, and systems for optimizing bulk palletization of items utilizing machine learning techniques to perform automated inspection throughout the process. Some aspects, more specifically, relate to a method that supports bulk palletization of items using machine learning techniques using sensor data to perform automated inspection of a pallet assembly. Machine learning systems analyze the alignment of the items ensuring proper orientation and positioning for layering. Sensors and cameras continuously capture the items layered onto the pallet where a machine learning system can analyze the data to determine misalignments on the layer. Cameras and sensors capture the side walls of the completed pallet and machine learning systems can analyze the data to detect defects along the side walls. An analysis can be performed to determine the severity of a defect and if the severity exceeds a threshold, then corrective actions resolve the defect.

Publication information

Citation

OpenTechnical Publication OT-2026-000002506, “Bulk Pallet Inspection and Assembly,” published September 15, 2026 at 19:13:31 UTC, https://opentechnical.org/p/OT-2026-000002506.

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