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This is a record of a document published elsewhere, first published by the United States Patent and Trademark Office, as US-6064759-A, on 16 May 2000. OpenTechnical did not first disclose it. The identifier, hashes and timestamps below record what this library served and when, not when the material became public. View the original.

OT-2026-000003155

Computer aided inspection machine

Published
Permanent URL
Classification
Sensors, Controls & Machine Vision › Position and Presence Sensing
Original source
US-6064759-A, the United States Patent and Trademark Office, 16 May 2000
Document SHA-256
1c3134ed0a6b4ffa7121109ddb7509cdf808328aacebf74c754a8211043a7918

An automatic inspection method and apparatus using structured light and machine vision cameras to inspect an object in conjunction with the geometric model of the object is disclosed. Camera images of the object are analyzed by computer to produce the location of points on the object's surfaces in three dimensions. During a setup phase before object inspection, the points are analyzed with respect to the geometric model computer file of the object. Many points are eliminated to reduce data-taking and analysis time to a minimum and to prevent extraneous reflections from producing errors. When similar objects are subsequently inspected, points from each surface of interest are spatially averaged to give high accuracy measurements of object dimensions. The inspection device uses several multiplexed sensors, each composed of a camera and a structured light source, to measure all sides of the object on a single pass. Calibration and compensation methods are also disclosed.

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Abstract

An automatic inspection method and apparatus using structured light and machine vision cameras to inspect an object in conjunction with the geometric model of the object is disclosed. Camera images of the object are analyzed by computer to produce the location of points on the object's surfaces in three dimensions. During a setup phase before object inspection, the points are analyzed with respect to the geometric model computer file of the object. Many points are eliminated to reduce data-taking and analysis time to a minimum and to prevent extraneous reflections from producing errors. When similar objects are subsequently inspected, points from each surface of interest are spatially averaged to give high accuracy measurements of object dimensions. The inspection device uses several multiplexed sensors, each composed of a camera and a structured light source, to measure all sides of the object on a single pass. Calibration and compensation methods are also disclosed.

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Publication information

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Citation

OpenTechnical Publication OT-2026-000003155, “Computer aided inspection machine,” published September 15, 2026 at 19:40:03 UTC, https://opentechnical.org/p/OT-2026-000003155.

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