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This is a record of a document published elsewhere, first published by the United States Patent and Trademark Office, as US-5008555-A, on 16 April 1991. OpenTechnical did not first disclose it. The identifier, hashes and timestamps below record what this library served and when, not when the material became public. View the original.

OT-2026-000003432

Optical probe with overlapping detection fields

Published
Permanent URL
Classification
Sensors, Controls & Machine Vision › Position and Presence Sensing
Assignee
EATON LEONARD TECHNOLOGIES
Original source
US-5008555-A, the United States Patent and Trademark Office, 16 April 1991
Document SHA-256
ba3fdc4f76393e95c65e34e0b03d26bd1e53778aab962649315b40a6db2a4008

An optical probe for measuring various parameters of bent tube comprises a somewhat V-shaped working head having first and second interconnected arms and slightly inwardly projecting end sections. Light sensitive diode arrays are mounted at the intersecting ends of the arms, and laser diode point light sources are mounted at the projecting end sections for directing sharply defined diverging light beams toward the arrays. A small diameter tube positioned within the sensitive area occludes sections of the light sensitive arrays to enable computation of the position of the centerline of the tube. Moving the probe in a scanning path along the tube enables a large number of measurements to be made for defining points on a best fit line that averages many measurements. From measured slopes of tangents from each laser to the circumference of a large tube of known tube diameter, coordinates of offsets of a point on the tube centerline are calculated. Orientation of the probe at the time of making the tangent measurements is stored, and after an approximate best fit line for the tube centerline has been determined, skew angles between the plane of the probe and the approximate best fit line are employed to correct the centerline point computations to obtain a corrected best fit line.

Abstract

An optical probe for measuring various parameters of bent tube comprises a somewhat V-shaped working head having first and second interconnected arms and slightly inwardly projecting end sections. Light sensitive diode arrays are mounted at the intersecting ends of the arms, and laser diode point light sources are mounted at the projecting end sections for directing sharply defined diverging light beams toward the arrays. A small diameter tube positioned within the sensitive area occludes sections of the light sensitive arrays to enable computation of the position of the centerline of the tube. Moving the probe in a scanning path along the tube enables a large number of measurements to be made for defining points on a best fit line that averages many measurements. From measured slopes of tangents from each laser to the circumference of a large tube of known tube diameter, coordinates of offsets of a point on the tube centerline are calculated. Orientation of the probe at the time of making the tangent measurements is stored, and after an approximate best fit line for the tube centerline has been determined, skew angles between the plane of the probe and the approximate best fit line are employed to correct the centerline point computations to obtain a corrected best fit line.

1. Drawings

[0001]Sheet 1.

[0002]Sheet 2.

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Publication information

Citation

OpenTechnical Publication OT-2026-000003432, “Optical probe with overlapping detection fields,” published September 15, 2026 at 20:26:48 UTC, https://opentechnical.org/p/OT-2026-000003432.

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