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This is a record of a document published elsewhere, first published by the United States Patent and Trademark Office, as US-12607459-B2, on 21 April 2026. OpenTechnical did not first disclose it. The identifier, hashes and timestamps below record what this library served and when, not when the material became public. View the original.

OT-2026-000000197

Real-time three-dimensional shape measurement system and shape measurement method using diagonal line pattern irradiation method

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Classification
Sensors, Controls & Machine Vision › Position and Presence Sensing
Original source
US-12607459-B2, the United States Patent and Trademark Office, 21 April 2026
Document SHA-256
164a2e5106d5ca8a76f5ce48210b8ee57f5e4dcecb427d3b2424d3a25aad0013

Abstract

The present disclosure relates to relates to a system and method for measuring a real-time three dimensional shape using a diagonal fringe pattern. Particularly, in the deflectometry applied to real-time three dimensional shape measurement of freeform surfaces, a system for acquiring a real-time three dimensional phase using a diagonal fringe pattern includes: a pattern generation portion that generates a single-direction pattern in the diagonal direction and project the generated pattern onto a measurement object; a detector that obtains an image of a deformed pattern reflected from the measurement object; and a phase acquisition portion that partially differentiates and integrates a phase of the diagonal pattern in the x axis direction and y axis direction respectively, to obtain an x axis direction phase component and a y direction phase component.

Publication information

Citation

OpenTechnical Publication OT-2026-000000197, “Real-time three-dimensional shape measurement system and shape measurement method using diagonal line pattern irradiation method,” published September 15, 2026 at 19:02:35 UTC, https://opentechnical.org/p/OT-2026-000000197.

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