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This is a record of a document published elsewhere, first published by the United States Patent and Trademark Office, as US-12605788-B2, on 21 April 2026. OpenTechnical did not first disclose it. The identifier, hashes and timestamps below record what this library served and when, not when the material became public. View the original.

OT-2026-000000342

Laser machining device, wafer processing system, and method for controlling laser machining device

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Classification
Manufacturing & Assembly Equipment › Joining and Welding
Original source
US-12605788-B2, the United States Patent and Trademark Office, 21 April 2026
Document SHA-256
8d375588f0adafc89ebd1cc16a31c93cbba01e3eeece0a541893a933411fb8d7

Abstract

The laser machining device includes an observation image acquiring unit configured to repeatedly acquire an observation image of a machining spot of laser light emitted from a laser optical system to a street on a wafer while a machined groove is being formed, a luminance detector configured to detect a luminance of a plasma generated at the machining spot by emission of the laser light based on the observation image every time the observation image acquiring unit acquires the observation image, a correspondence information obtaining unit configured to obtain correspondence information indicating a correspondence relationship among the luminance, energy of the laser light and a machined state of the machined groove, and a machined state assessing unit configured to assess the machined state with reference to the correspondence information based on the luminance and known energy of the laser light every time the luminance detector detects the luminance.

Publication information

Citation

OpenTechnical Publication OT-2026-000000342, “Laser machining device, wafer processing system, and method for controlling laser machining device,” published September 15, 2026 at 19:02:46 UTC, https://opentechnical.org/p/OT-2026-000000342.

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