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This is a record of a document published elsewhere, first published by the European Patent Office, as EP-4692782-A1, on 11 February 2026. OpenTechnical did not first disclose it. The identifier, hashes and timestamps below record what this library served and when, not when the material became public. View the original.

OT-2026-000003026

End effector, flaw detection system, and method for inspecting inspection target

Published
Permanent URL
Classification
Robotics & Automation › Robot Architectures
Inventors
ISHIDA MAKOTO, MATSUMOTO TAKAYUKI
Assignee
MITSUBISHI HEAVY IND LTD
Original source
EP-4692782-A1, the European Patent Office, 11 February 2026
Document SHA-256
015ca1278244ac048dc9c4a9b7d3306bfd87088093307be3654f5f83a09a7426

Abstract

A robot arm (40) is provided with an end effector (70) that grips a probe so as to bring the probe (50) into contact with an inspection target. The end effector includes an elastic member that is compressed by a force applied to the probe from the inspection target, thereby allowing the probe to be displaced in the direction of the compression.

Publication information

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Citation

OpenTechnical Publication OT-2026-000003026, “End effector, flaw detection system, and method for inspecting inspection target,” published September 15, 2026 at 19:16:49 UTC, https://opentechnical.org/p/OT-2026-000003026.

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This record reproduces a document published elsewhere and is provided for reference and study. Rights in the original remain with its owner. See the publication policy.