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This is a record of a document published elsewhere, first published by the United States Patent and Trademark Office, as US-12607461-B2, on 21 April 2026. OpenTechnical did not first disclose it. The identifier, hashes and timestamps below record what this library served and when, not when the material became public. View the original.

OT-2026-000000262

Apparatus for ultrasonically measuring thin film thickness with retroreflector and method thereof

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Classification
Sensors, Controls & Machine Vision › Position and Presence Sensing
Original source
US-12607461-B2, the United States Patent and Trademark Office, 21 April 2026
Document SHA-256
294ade109679e62a54c94d321432945169c458bda0a030219ea2260dbda138a5

Abstract

A thin film thickness measuring apparatus includes: an ultrasonic retroreflector that is provided under a test object formed in the shape of a thin film and retroreflects an ultrasonic wave incident through the test object; an ultrasonic wave input portion that is provided on one side of the test object and inputting an ultrasonic wave to one side of the test object; and a measurement portion that is connected to the ultrasonic wave input portion and measures an arrival time of the ultrasonic wave reflected through the test object.

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Citation

OpenTechnical Publication OT-2026-000000262, “Apparatus for ultrasonically measuring thin film thickness with retroreflector and method thereof,” published September 15, 2026 at 19:02:40 UTC, https://opentechnical.org/p/OT-2026-000000262.

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