Abstract
A backscatter x-ray system has an x-ray device, a movable platform, and a processor. The x-ray device includes an x-ray emitter and an x-ray detector. The movable platform positions the x-ray device relative to a frontside of a structure. The processor is communicatively couplable to the x-ray device. The x-ray emitter emits x-rays that penetrate the structure from the frontside. The x-ray detector detects a backscatter of the x-rays reflected from the structure. The processor generates x-ray images of the structure based on the backscatter, and analyzes the x-ray images in a manner facilitating at least one of manufacturing and inspection of the structure.