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This is a record of a document published elsewhere, first published by the United States Patent and Trademark Office, as US-12607453-B2, on 21 April 2026. OpenTechnical did not first disclose it. The identifier, hashes and timestamps below record what this library served and when, not when the material became public. View the original.

OT-2026-000000299

System and method for synchronously detecting thickness and double-side surface profiles

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Sensors, Controls & Machine Vision › Position and Presence Sensing
Original source
US-12607453-B2, the United States Patent and Trademark Office, 21 April 2026
Document SHA-256
48e09038f98c5f504e36971b18a9944ca5c502ba3e1d062efbabc8153bd224d9

Abstract

A system and a method for synchronously detecting thickness and double-side surface profiles that belongs to the technical field of optical measurement. The system includes a light source system, a deflection reflection system, a camera acquisition system, and a processing system. The deflection reflection system includes a decomposition unit and an integration unit. In the system, an optical signal is projected to an upper surface and a lower surface of an object to be measured by the decomposition unit, and then reflected light is converged by the integration unit to form a composite signal, which is captured by a camera to generate an image. The processing system analyzes the image to accurately obtain the thickness and double-side surface profile data of the object.

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OpenTechnical Publication OT-2026-000000299, “System and method for synchronously detecting thickness and double-side surface profiles,” published September 15, 2026 at 19:02:43 UTC, https://opentechnical.org/p/OT-2026-000000299.

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